StochFit is a complete environment for modeling specular x-ray reflectivity data. It provides stochastic model independent and stochastic model dependent techniques in order to locate the global minimum for the data fit. The GUI is written in C# and the backend is written in C++. All numerically intensive routines are threaded using the OpenMP API in order to split the calculation over multiple cores.
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30 Day SummaryJan 3 2023 — Feb 2 2023
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12 Month SummaryFeb 2 2022 — Feb 2 2023
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